研究者从国家杨明交通大学(台湾)发表了一篇技术论文题为“机器学习方法建模的内在参数波动Gate-All-Around Si Nanosheet mosfet。”"This study has comprehensively analyzed the potential of the ANN-based ML strategy in modeling the effect of fluctuation sources on electrical characteristics of GAA Si NS MOSF...»阅读更多
