中文 English

Author's Latest Posts


Choosing The Right Memory At The Edge


As the amount of data produced by sensors in cars and phones continues to grow, more of that data needs to be processed locally. It takes too much time and power to send it all to the cloud. But choosing the right memory for a particular application requires a series of tradeoffs involving cost, bandwidth, power, which can vary greatly by device, application, and even the data itself. Frank Fer...» read more

Multi-Die Integration


Putting multiple heterogeneous chips is the way forward for improved performance and more functionality, but it also brings a host of new challenges around partitioning, layout, and thermal. Michael Posner, senior director for die-to-die connectivity at Synopsys, talks about the advantages of 3D integration, why it’s finally going mainstream, and what’s needed in the EDA tools to make this ...» read more

Ernest Worthman blogs


» read more

Efficient Trace In RISC-V


Systems with RISC-V cores often include multiple types of other processors and accelerators. Peter Shields, product manager for Tessent at Siemens Digital Industries Software, talks about what's needed for debug and trace in context, including the need for unobtrusive observation at full speed, what to trace and when to trace it, and how embedded IP can identify to report which branches are tak...» read more

Increased Photomask Density And Its Impact On EDA


在photoma打印曲线形状的能力sks can have big repercussions on semiconductor design. Aki Fujimura, CEO of D2S, explains why mask rule checking has been bound by complex design rules, and why curvilinear shapes are important for reducing margin and simplifying the chip design process.» read more

沉默的数据损坏


Defects can creep into chip manufacturing from anywhere, but the problem is getting worse at advanced nodes and in advanced packages where reduced pin access can make testing much more difficult. Ira Leventhal, vice president of U.S. Applied Research and Technology at Advantest America, talks about what’s causing these so-called silent data errors, how to find them, and why it now requires ma...» read more

Improving Chip Efficiency, Reliability, And Adaptability


Peter Schneider, director of Fraunhofer Institute for Integrated Circuits' Engineering of Adaptive Systems Division, sat down with Semiconductor Engineering to talk about new models and approaches for ensuring the integrity and responsiveness of systems, and how this can be done within a given power budget and at various speeds. What follows are excerpts of that conversation. SE: Where are y...» read more

Why Matter 1.0 Really Matters


Incompatibilities of consumer devices inside the home are frustrating for consumers and a security risk. Skip Ashton, distinguished engineer at Infineon, talks about how the Matter 1.0 standard will fuse together different ecosystems from companies such as Apple, Google, and Amazon, how it will be applied to existing devices, what’s included and missing from the standard today, and how it can...» read more

Making Chips Yield Faster At Leading-Edge Nodes


Simulation for semiconductor manufacturing is heating up, particularly at the most advanced nodes where data needs to be analyzed in the context of factors such as variation and defectivity rates. Semiconductor Engineering sat down with David Fried, corporate vice president of computational products at Lam Research, to talk about what's behind Lam's recent acquisition of Esgee Technologies, ...» read more

Where All The Semiconductor Investments Are Going


Companies and countries are funneling huge sums of money into semiconductor manufacturing, materials, and research — at least a half-trillion dollars over the next decade, and maybe much more — to guarantee a steady supply of chips and know-how to support growth across a wide swath of increasingly data-centric industries. The build-out of a duplicate supply chain that can guarantee capac...» read more

← Older posts Newer posts →
Baidu